HYPSTER targets a new microscope for characterization at the nanoscale with light spectroscopy in an unprecedented range from from λ=3 μm to 3 mm.
The imaged sample is a graphene monolayer transferred on SiO2 and patterned using e-beam lithography. Both spiral and straight lines are 100 nm wide. The graphene layer is etched inside the patterns. A: topography (AFM signal). B: s-SNOM mid-infrared image at λ = 10 μm (2nd harmonic demodulation). C: s-SNOM THz image at λ = 118 μm (2nd harmonic demodulation).