LprobeSoft0.5_Au-Si-30

Unique advantages

  • Tapered Streamlined Long Tip
  • Vertical sidewall chip for safe handling
  • Tip view

Applications

  • Soft materials
  • Biological samples
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Order code : LS0P5_Au-Si-30

Probe overview

Special packaging

Spectroscopy and images with SNOM tips that have been packaged in standard AFM Gel-Pak boxes can lead to artifacts in the optical response. This is due to contamination of the tip by a few molecules of the gel. Vmicro has developed a back-end process with special decontamination and storage in a metal box. You can select this feature as an option when selecting your reference.


Nano-FTIR spectra normalized and obtained at the SMIS beamline at Synchrotron SOLEIL. (Courtesy F. Borondics – G. Németh)

Features

Lprobes are based on a new MEMS patented technology enabling improvements as compared to silicon AFM cantilevers with tip fabricated using mainstream processes developed in the 90’s.

Vmicro In-plane technology enables full batch fabrication of tips with high lengths, low masses and high aspect ratios not only close to apex.

Both cantilever and tip are made of highly doped monocrystalline silicon.

Lprobes are compatible with most SPMs. Our chip is designed with vertical sidewalls that enable safer handling with tweezers.

Probe parameters

Resonant frequency (kHz)
Nom.
Typical range
80
50-100
Spring constant (N/m)
Nom.
Typical range
0.5
0.1-1

Cantilever

Cantilever (nominal values)
L (µm)
W (µm)
t (µm)
80
20
0.65
Coating
Cantilever back side
Au
Tip side
Si

Highly conductive silicon tip and cantilever with a 40nm thick gold coating on the top side, providing optimal laser reflection.

Tip

Tip dimensions
Nom.
Typical range
Tip height T (µm)
30
15-50
Apex radius (nm)
7
2-10
  • Tilted tip design
    Compensates for the AFM head’s mounting angle, ensuring accurate data on diverse sample surfaces.
  • Tip height >30 µm
    Enables imaging of deeper or difficult-to-access sample regions.
  • Half-cone angle < 10° over the last 10 µm 
    Minimizes tip-sample convolution, ensuring more accurate morphological measurements.
  • Guaranteed tip radius < 10 nm
    Provides reliable resolution for advanced AFM applications.

Related products

Lprobes: AFM Probes based on in-plane silicon technology