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AFM Probes
Microfabrication
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Microfabrication steps expertise
Microfabrication full device processing
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AFM Probes
Microfabrication
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Microfabrication steps expertise
Microfabrication full device processing
Contact
My account
Lprobes: AFM Probes based on in-plane silicon technology
Probes defined by X,Y lithography: new shapes and angles are unlocked.
Long and ultralong tips with low mass become feasible (Pat. Pending)
All processing steps are compatible with batch fabrication on silicon wafers for volume production
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