Lprobes: AFM Probes based on in-plane silicon technology

  • Probes defined by X,Y lithography: new shapes and angles are unlocked. 
  • Long and ultralong tips with low mass become feasible (Pat. Pending)
  • All processing steps are compatible with batch fabrication on silicon wafers for volume production
Unique advantages 
  • Tapered Streamlined Long Tip
  • Vertical sidewall chip for safe handling
  • Tip view 

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