Lprobes: AFM Probes based on in-plane silicon technology
- Probes defined by X,Y lithography: new shapes and angles are unlocked.
- Long and ultralong tips with low mass become feasible (Pat. Pending)
- All processing steps are compatible with batch fabrication on silicon wafers for volume production
Unique advantages
- Tapered Streamlined Long Tip
- Vertical sidewall chip for safe handling
- Tip view
